Connect
Connect with your peers and expert faculties worldwide
Campus
Get updates and access resources from your institution
Books
Find and buy ebooks for any university, course or subject
Videos
Easy to understand curated quality videos from OERs
Skills
Industry-required latest skill courses with certifications
Preps
Prepare, self-assess and practice for various exams
Interns
Find and apply for internships to gain industry experience
Jobs
Find & apply for jobs specific to your academics & interests
News
Latest Educational News and Articles
Welcome uLektz
Bookstore
uLektz
All-in-one system for education, skills and careers
uLektz Connect
Social Learning Platform to connect, share and learn
uLektz Campus
College / University Management Software(ERP)
uLektz Books
Digital Learning Materials – eBooks, Videos, Notes, etc.
uLektz Skills
Industry-required latest skill courses with certifications
uLektz Interns
Internships to gain real-time industry experiences
uLektz Jobs
Jobs & placements directly from the industry
uLektz News
Latest educational news & events from India & abroad
uLektz Events
Latest events exclusively for Higher Education
uLektz Scholarships
Scholarships exclusively for Higher Education
All-in-one system for education, skills and careers
uLektz Connect
Social Learning Platform to connect, share and learn
uLektz Campus
College / University Management Software(ERP)
uLektz Books
Digital Learning Materials – eBooks, Videos, Notes, etc.
uLektz Skills
Industry-required latest skill courses with certifications
uLektz Interns
Internships to gain real-time industry experiences
uLektz Jobs
Jobs & placements directly from the industry
uLektz News
Latest educational news & events from India & abroad
uLektz Events
Latest events exclusively for Higher Education
uLektz Scholarships
Scholarships exclusively for Higher Education
Published by uLektz
Course Code | : | P1ECBC03 |
Author | : | uLektz |
University | : | Biju Patnaik University of Technology (BPUT) |
Regulation | : | 2016 |
Categories | : | Electronics & Communication |
Format | : | ![]() |
Type | : | eBook |
FREE
Buy NowDescription :INTEGRATED CIRCUIT DESIGN of P1ECBC03 covers the latest syllabus prescribed by Biju Patnaik University of Technology (BPUT) for regulation 2016. Author: uLektz, Published by uLektz Learning Solutions Private Limited.
Note : No printed book. Only ebook. Access eBook using uLektz apps for Android, iOS and Windows Desktop PC.
1.1 The CMOS Inverters and CMOS Logic Gates - The Static View: Introduction to CMOS Inverter, Introduction to Static CMOS Design, The Dynamic Behavior - Power, Energy and Energy - Delay
1.2 Complementary CMOS, Pass-Transistor Logic, Transmission gates, Technology Scaling and its Impact on the Inverter Metrics
1.3 Dynamic CMOS Logic, Timing Metrics: Dynamic CMOS Design, CMOS Logic Design Perspectives
1.4 Timing Metrics: Timing Metrics for Sequential Circuits, Classification of Memory Elements
2.1 Basic Building Blocks: Inverter with Active Load, Cascode, Cascode with Cascode Load
2.2 Source Follower, Threshold Independent Level Shift, Improved Output Stages
2.3 Current and Voltage Sources: Current Mirrors, Current References, Voltage Biasing, Voltage References
2.4 CMOS Operational Amplifiers: General Issues, Performance Characteristics
2.5 Basic Architecture, Two Stage Amplifier, Frequency Response and Compensation, Slew Rate
3.1 Overview of Mixed-Signal Testing – Mixed-signal circuits, Test and diagnostic equipments, Mixed-signal testing challenges
3.2 The Test Specification Process – Device datasheets, Generation of test plan, Components of a test program
3.3 DC and Parametric Measurements –Continuity, Leakage currents, Power supply currents, DC references and regulators, Impedance measurements, DC offset measurements, DC gain measurements, DC power supply rejection ratio, DC common-mode rejection ratio, Comparator DC tests, Voltage search techniques, DC tests for digital circuits
3.4 Measurement Accuracy – Terminology
3.5 Calibration and checkers, Dealing with measurement errors, Basic data analysis
3.6 Tester Hardware – Mixed-signal tester overview, DC resources, Digital subsystem, AC source and measurement, Time measurement system, Computing hardware
3.7 IDDQ Testing, Design for Testability, Built-In Self-Test, Boundary Scan, Analog Test Bus, System Test and Core Test
4.1 Overview of LDMOS, Power MOS, Floating Gate MOS
4.2 Emerging Technology: Overview of HEMT, FinFET, Organic FET (OFET), Graphene nano-ribbon field effect transistor (GNRFET)
4.3 IC Design for Internet of Everything (IoE): Overview of Analog IC, Digital & Memory IC, Mixed-Signal IC, RF/MM-Wave/Terahertz IC
Our Products
Programmes
Partnership & Alliances Programme
Solutions
Educational ERP for
Colleges and Universities
Company
© 2019 uLektz Learning Solutions Private Limited - All Rights Reserved
This book will be added to your My Books. Do you want to continue?
Your Free trial Limit Exceeded.Would you like to buy it?
Please enter code
Thanks for your mail conformation. Your account will be activated Soon.
Enter your Email ID and mobile Number
You'll use this number and email id when you log in and if you ever need to reset your password.
By clicking “Continue”, you agree to the uLektzTerms of Services and Privacy Policy.
Existing User?Log in
Enter your Email ID and mobile Number
You'll use this number and email id when you log in and if you ever need to reset your password.
Verify your Account
An OTP has been sent to your email ID and mobile number
Verify your Account
An OTP has been sent to your email ID and mobile number
Set your Password
An OTP has been sent to your email ID and mobile number
Set your Password
An OTP has been sent to your email ID and mobile number
Login to uLektz
Forgot Password
Sign everyone else out and sign me inCreate new uLektz account
Forgot password
Create new password
This book will be added to your library. Do you want to continue?