Book Details

INTEGRATED CIRCUIT DESIGN

INTEGRATED CIRCUIT DESIGN

Published by uLektz

Course Code : P1ELBC04
Author : uLektz
University : Biju Patnaik University of Technology (BPUT)
Regulation : 2016
Categories : General Engineering
Format : ico_bookePUB3 (DRM Protected)
Type :

eBook

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Description :INTEGRATED CIRCUIT DESIGN of P1ELBC04 covers the latest syllabus prescribed by Biju Patnaik University of Technology (BPUT) for regulation 2016. Author: uLektz, Published by uLektz Learning Solutions Private Limited.

Note : No printed book. Only ebook. Access eBook using uLektz apps for Android, iOS and Windows Desktop PC.

Topics
UNIT I THE CMOS INVERTERS AND CMOS LOGIC GATES – THE STATIC VIEW AND DYNAMIC CMOS LOGIC, TIMING METRICS

1.1 The CMOS Inverters and CMOS Logic Gates - The Static View: Introduction to CMOS Inverter, Introduction to Static CMOS Design, The Dynamic Behavior - Power, Energy and Energy - Delay

1.2 Complementary CMOS, Pass-Transistor Logic, Transmission gates, Technology Scaling and its Impact on the Inverter Metrics

1.3 Dynamic CMOS Logic, Timing Metrics: Dynamic CMOS Design, CMOS Logic Design Perspectives

1.4 Timing Metrics: Timing Metrics for Sequential Circuits, Classification of Memory Elements

UNIT II BASIC BUILDING BLOCKS, CURRENT AND VOLTAGE SOURCES AND CMOS OPERATIONAL AMPLIFIERS

2.1 Basic Building Blocks: Inverter with Active Load, Cascode, Cascode with Cascode Load

2.2 Source Follower, Threshold Independent Level Shift, Improved Output Stages

2.3 Current and Voltage Sources: Current Mirrors, Current References, Voltage Biasing, Voltage References

2.4 CMOS Operational Amplifiers: General Issues, Performance Characteristics

2.5 Basic Architecture, Two Stage Amplifier, Frequency Response and Compensation, Slew Rate

UNIT III TESTING AND MEASUREMENTS

3.1 Overview of Mixed-Signal Testing – Mixed-signal circuits, Test and diagnostic equipments, Mixed-signal testing challenges

3.2 The Test Specification Process – Device datasheets, Generation of test plan, Components of a test program

3.3 DC and Parametric Measurements –Continuity, Leakage currents, Power supply currents, DC references and regulators, Impedance measurements, DC offset measurements, DC gain measurements, DC power supply rejection ratio, DC common-mode rejection ratio, Comparator DC tests, Voltage search techniques, DC tests for digital circuits

3.4 Measurement Accuracy – Terminology

3.5 Calibration and checkers, Dealing with measurement errors, Basic data analysis

3.6 Tester Hardware – Mixed-signal tester overview, DC resources, Digital subsystem, AC source and measurement, Time measurement system, Computing hardware

3.7 IDDQ Testing, Design for Testability, Built-In Self-Test, Boundary Scan, Analog Test Bus, System Test and Core Test

UNIT IV OVERVIEW OF MOS, EMERGING TECHNOLOGY AND IC DESIGN FOR INTERNET OF EVERYTHING (IOE)

4.1 Overview of LDMOS, Power MOS, Floating Gate MOS

4.2 Emerging Technology: Overview of HEMT, FinFET, Organic FET (OFET), Graphene nano-ribbon field effect transistor (GNRFET)

4.3 IC Design for Internet of Everything (IoE): Overview of Analog IC, Digital & Memory IC, Mixed-Signal IC, RF/MM-Wave/Terahertz IC

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